Measurement and Control Show 2007 TOKYO
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Tutorial

Tutorial Sessions lecture systematically  fundamental knowledges about Measurement and Control technique.

On-Site Fee 10,000yen

11/7(Wed.) 13:30-16:30
T1 The basic knowledge on analog circuits for digital measurement engineers SOLD OUT
Part1-Basic analog technologies for electronic measurement engineers
Haruo KobayashiHaruo Kobayashi
Professor
Graduate School of Engineering, Electronic Engineering Department
Gunma University
Waveform sampling is one of very important technologies for measuring analog circuit performance and designing high performance analog systems. This tutorial will review and discuss several sampling techniques for analog technologies, such as coherent sampling, oversampling,equivalent-time sampling, sequential sampling, random sampling, down sampling, sub-sampling,up-sampling, impulse sampling, non-uniform sampling, sampling rate conversion, and also explain switched-capacitor circuits and aperture jitter effects in sampling circuits.
Part2-Basic analog technologies for electronic measurement engineers
Takanori Komuro, Ph.D.Takanori Komuro, Ph.D.
R&D Senior Engineer
Hachioji Semiconductor Test Division
Agilent Technologies International Japan, Ltd.
Electronic measurement is one of the basic technologies, and it covers wide area of technologies, which have been making rapid progress; it is very hard to get its total understandings. In this lecture, I will explain analog technologies in electric measurement through the following topics:
1) Error, which measurement equipment has and which its user adds.
Keyword: “Specification”, “Zout and Zin”, “Error, incorrect operation and destruction”
2) Harmony between design and measurement.
Keyword: “Computer and measurement”, “Total develop environment”
3) Hints for new measurement.
Keyword: “New measurement with old technique”, “Boundary between DUT and equipment”, “Interoperability”
Part3-Tips for Oscilloscope Probing Techniques and Bus Analysis
You Kaneko You Kaneko
Communication & Measurement Business Headquarters
High Frequency Measurement Development Center
Yokogawa Electric Corp.
1) Oscilloscope Probe Usage
Oscilloscope is necessary tool for waveform measurement of analog circuits.  Waveform shape is changed by probing technique.  Waveform is changed by probing method from load effects. This seminar introduces probing technique with load effects by examples of equivalence circuit models and illustrates how to select correct proves for waveform measurement.
2) Oscilloscope function trend
Oscilloscope provides not only waveform measurement tool but also various analysis function by measurement applications.


11/8(Thu.) 13:30-15:30

T2 The newest measurement technology for supporting automobile safety
The Newest Measurement Technology for Supporting Automobile Safety
Seiichi ShinSeiichi Shin
Professor
Department of System Engineering, Faculty of Electro-Communcaitions
University of Electro-Communications
Car is dangerous although it is indispensable for today's life. Measurement takes a very important role for the safety of cars with vast kinetic energy. Camera is a sort of the measurement. There are many cameras in a car for back view, front view, side view, and so on. Infrared camera, which is called as Night View, is also installed in a car. Moreover, a millimeter wave radar, which is robust to rain and fog, is added and sensor fusion is a keyword for nowadays safety cars.
Another trend is watching a driver and passengers by cameras and other sensors. It is already commercialized a camera for preventing from inattentive driving. Moreover, sensors for preventing from drowsy driving, drinking driving, and so on. This lecture presents these new movements of measurement technology for automobiles with some examples.


11/9(Fri.) 13:30-15:30

T3 The 3D scanning technology to raise productivity
Convergence Engineering - Advanced Digital Engineering Applications
with 3D Scanning Technologies
HIROMASA SUZUKIHiromasa Suzuki
Professor
Research Center for Advance Science and Technology
The University of Tokyo
By recent advancement of 3D scanning technologies such as X-rays CT and optical scanners, utilization of scanned data has spread into various new engineering applications such as CAD and CAE. In addition to traditional Reverse Engineering to generate surface models from clay models, scanned data is used for generating CAE models to evaluate performance of purchased parts and for modifying CAD model of a stamping die corrected by a veteran technician. However, today it requires tedious manual work in these applications in order to import scanned data to CAD and CAE systems. In this seminar, I introduce data processing technologies for data acquisition and modeling with several practical cases.

     *No simultaneous interpretation will be provided. Please note that speakers and lecture themes are subject to change.